========== AsAP1 testing
- measure one processor:
- oscillator frequencies for some number of settings
- max operating frequency
- power dissipation
- clock tree, oscillator, "ext clock" tree
- inter-processor interconnect
- ALU
- MAC
- IMEM
- DMEM
- power grid noise
- across supply voltages
- across instruction types
- across different data values (random, worst case, fix one input,...)
- across all processors
- across task kernels and complex applications
- across temperatures
- estimate affect of on-chip noise by running multiple procs
- measure max freq
- measure voltage/waveform on one lifted power pad(?)
- Goals
- publish key data
- learn for future chips
- getting test environment stable and ready for application
development, especially by outsiders and new students
========== AsAP2 testing
[everything listed above for AsAP1, plus...]
- leakage
- find optimal VddHi/VddLow/VddAlwaysOn for different apps for optimum
performance/energy/ExT
Last update: February 7, 2009